AGILENT 93000 SOC SERIES USER TRAINING

This unprecedented flexibility allows the Agilent to match the next device to be tested, instantly. As test needs change to accommodate a new class of device or next-generation performance, the Pin Scale can be instantly reconfigured through software to maximize the lifetime of your investment. Also beneficial to generate low jitter high-speed clock signals. Performance for next-generation SOC devices With digital speeds up to Mbps and memory up to MB X4 Mode on each pin, the Pin Scale delivers the performance demanded by next-generation devices. Available per-pin licenses for memory depth: Provides performance for high speed interface test, such as DDR, operating over Mbps. Add this document to saved. Test Processor-Per-Pin architecture Localizing all test processing instead of using centralized resources results in minimal measurement overhead and higher throughput.

As test needs change to accommodate a new class of device or next-generation performance, the Pin Scale can be instantly reconfigured through software to maximize the lifetime of your investment. Add this document to saved. Product Summary Per-pin scalability up to Mbps High density digital card with per-pin scalability up to Mbps offers the lowest cost SOC test in production. This lowers immediate capital investment and provides for future growth as devices evolve from generation to generation, integrating more high-speed interfaces or achieving higher processing speeds. You can add this document to your saved list Sign in Available only to authorized users. This enables the Agilent to offer the following pin counts:

Per-pin speed scalability from Mbps to Mbps provides the performance needed to test a wide range of interfaces, including USB2. Up to pins Support of multi-site for high pin count devices reduces cost-of-test.

Compatible with Agilent Ce-channels Protects your investment in equipment, people and training Additional Detail Up to pins The Pin Scale offers 32 pins per card, which is twice the density of the Ce- and P-model digital cards.

Also beneficial to generate low jitter high-speed clock signals. With per-pin licenses to enable the different speed and memory performance levels — part of the industry-first Agilent InstaPin performance library — the Pin Scale digital card can be configured to match the device requirements, pin-by-pin, resulting in the lowest cost of test.

Testing in higher x-modes means that more logical vector memory is available. Per-pin scalability from to Mbps The test system can be configured to match device requirements, pin-by-pin, for lowest cost.

Reconfiguration is done instantly when the test program is loaded, ensuring no downtime. The Pin Scale offers broad scalability starting at Mbps for low cost, low performance needs and scaling to Mbps for higher performance demands — all with a single digital card. Per-pin software licenses for speed and memory depth mean you add just the performance you need, when you need it. Each pin of the Pin Scale can be scaled over its wide memory depth and speed range through per-pin software licenses, which provides the lowest cost of test by allowing the test system to be configured to match device requirements, pin-by-pin.

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This enables the Agilent to offer the following pin counts: As test needs change to accommodate a new class of device or next-generation performance, the Pin Scale can be instantly reconfigured through software to maximize the lifetime of your investment.

Agilent Pin Scale

The value of parallel test, however, depends on its efficiency. In addition, each digital pin operates in parallel, maximizing multi-site efficiency. Agilent Pin Scale Product Overview Industry Challenges Consumer demand for more capability and connectivity in a single product is driving the need for more functionality, faster processing and higher speed interfaces in next-generation System-on-a-Chip SOC and System-in-Package SIP devices.

Add this document to collection s. Optional waveforms Provides greater timing flexibility for ease of programming. Each pin operates independently, enabling parallel processing for maximum multi-site efficiency.

You can add this document to your saved list Sign in Available only to authorized users. And this must all be done at a lower costof-test than last year because of ongoing price erosion.

Test Processor-Per-Pin architecture Localizing all uder processing instead of using centralized resources results in minimal measurement overhead and higher throughput.

Agilent 93000 Pin Scale 800

Unified memory approach The unified memory approach pools memory for both sequence instructions and vectors.

Add this document to saved. You can add this document to your study collection s Sign in Available only to authorized users. An uncertain future demands the ability to upgrade quickly to meet the next performance challenge while continuing to reduce cost-of-test. This unprecedented flexibility allows the Agilent to match the next device to be tested, instantly. Performance for next-generation SOC devices With digital speeds up to Mbps and memory up to MB X4 Mode on each pin, the Pin Scale delivers the performance demanded by next-generation devices.

This lowers immediate capital investment and provides for future growth as devices evolve from generation to generation, integrating more high-speed interfaces or achieving higher processing speeds. Add Upload document Create flashcards. For printed directions on Preparing for Registration. Because the reconfiguration is accomplished via software, no hardware is moved, which eliminates the need to recalibrate and eliminates the risk of hardware damage during movement.

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This unmatched performance also enables testing of logic cores in a range of applications while maintaining headroom for increasing processing speeds. Flexible waveform generation for high-speed applications.

Add to collection s Add to saved. The entire amount of purchased memory is available for both test vectors and sequencer instructions, which provides more flexibility than architectures based upon two unshared memory areas. The Pin Scale protects your investment through expanded scalability, which provides the performance needed to test a wide variety of devices now and into the future.

With 32 pins on the Pin Scale digital card, an Agilent can be configured with up to pins, providing the pin count needed for multi-site test of even high pin count devices. To test these devices, a test system must have the capability to address a range of performance challenges: This results in minimal measurement overhead and higher throughput.

Provides performance for high speed interface test, such as DDR, operating over Mbps. Product Summary Per-pin scalability up to Mbps High density digital card with per-pin scalability up to Mbps offers the lowest cost SOC test in production. Unified memory approach The entire amount of purchased memory is available for both test vectors and sequencer instructions for maximum flexibility. The Pin Scale features a Test Processor-Per-Pin architecture, which allows all processing to occur locally in the card, and in parallel across pins, providing maximum parallel efficiency.

Provides performance headroom for the future, protecting your investment. Available per-pin licenses for memory depth: Agilent InstaPin also maximizes asset utilization because the per-pin licenses for speed and memory depth of Pin Scale digital cards can float between pins on a card, cards in a tester and testers on a test floor or different production facilities around the world.